📢 New Paper Published: Influence of KMnO4 Concentration on the Physical and Dielectric Properties of Potassium Ion Conducting PVdF‑HFP Polymer Electrolytes!🚀
Advanced Laboratory
Cutting-edge instruments and precision tools engineered for breakthrough research and development in materials science and nanotechnology.

Sputter deposition is a physical vapor deposition method that deposits thin films. Auto500 is a versatile front-loading coating system with a box chamber for R&D or pre-production use.

The Hitachi SU 3800 performs high-resolution characterization and analysis, yielding precise, genuine nanoscale scale information.

The X-ray diffractometer is an adaptable instrument that may be used to analyze powders, thin films, epitaxial layers, machined materials, ceramics, and other materials via X-ray diffraction.

AFM stands for Atomic Force Microscopy. It's a powerful imaging technique used in nanotechnology and materials science. AFM works by scanning a tiny probe over a sample's surface and measuring the forces between the probe & sample to create high-resolution images.

Novus Tribo Solutions Pin-on-Disc Wear Testing Machine is a precise tool that replicates sliding wear conditions between two materials.

The ZM2376 LCR meter is a precision measurement tool designed to evaluate inductance (L), capacitance (C), resistance (R), and impedance (Z) across a wide frequency spectrum.

Hyper-15 is a tabletop type miniature micro machine tool with multi-process capability. This tool can perform processes such as Micro Turning (Vertical with a tool mounted on the Spindle), Micro Milling, Micro Drilling, Micro EDM Drilling, and Micro Scanning EDM (EDM Milling).

The Piezo-based Dynamometer represents a breakthrough in force measurement technology. Utilizing piezoelectric sensors, it converts mechanical stress into electrical signals with remarkable accuracy and sensitivity.