📢 New Paper Published: Influence of KMnO4 Concentration on the Physical and Dielectric Properties of Potassium Ion Conducting PVdF‑HFP Polymer Electrolytes!🚀
Precision nanoscale surface imaging and analysis for advanced materials research
Core AFM
Atomic Force Microscopy (AFM) is a powerful imaging technique used in nanotechnology and materials science. The Core AFM scans a tiny probe over a sample's surface, measuring the forces between the probe and the sample to observe high-resolution topography images.
Various operating modes: Contact mode, Tapping mode, Magnetic force microscopy (MFM), Electrical force microscopy (EFM), Force modulation, Standard and Advanced lithography, and spectroscopy.
Capable of topography image measurement of solid and biological samples.
Mountain SPIP commercial license image analysis software for visualization and analysis of AFM images.
The Core AFM is extensively used for surface topography analysis, material properties at the nanoscale, biological samples, surface roughness measurement, and electrical property mapping across various scientific disciplines.
Unmatched Precision in Surface Imaging and Analysis
