📢 New Paper Published: Influence of KMnO4 Concentration on the Physical and Dielectric Properties of Potassium Ion Conducting PVdF‑HFP Polymer Electrolytes!🚀
Advanced crystallographic analysis for comprehensive material structure characterization
D6 PHASER
The D6 PHASER X-ray diffractometer is an adaptable instrument designed for analyzing powders, thin films, epitaxial layers, ceramics, and other materials through X-ray diffraction. This technique involves directing main X-rays at the sample substance, where its wave nature causes diffraction at specific angles, providing information on the crystal structure.
XRD measurement with a 1.2KW X-ray tube source.
Accurate XRD pattern measurement with ±0.01° precision.
Various specimen holders for user-defined applications in pharmaceuticals, materials science, life science, and engineering.
Vacuum chuck for tiny thin film samples and wafer testing. X-Ray Reflectometry (XRR) for thickness, density, and roughness measurement.
The D6 PHASER XRD is extensively used in material research, pharmaceuticals, energy sector, semiconductor industries, and crystallographic research. Its versatile capabilities make it essential for comprehensive material analysis.
Precision Analysis for Advanced Material Research
