📢 New Paper Published: Influence of KMnO4 Concentration on the Physical and Dielectric Properties of Potassium Ion Conducting PVdF‑HFP Polymer Electrolytes!🚀
Advanced high-resolution characterization and analysis for precise nanoscale surface information
SU3800 Hi-SEM with EDS and Sputter Coater
The Hitachi SU3800 SEM performs high-resolution characterization and analysis, yielding precise nanoscale surface information. It is equipped with advanced optics and detection systems, including SE, BSE, UVD, and STEM detectors. The SEM provides comprehensive information about specimen surface morphology, with an EDS system for elemental composition analysis.
Five-axis motorized stage with a maximum specimen size of 200mm in diameter.
High resolution: 3.0 nm at 30kV (High Vacuum Mode) for SE, and 4.0 nm at 30kV (Low Vacuum Mode) for BSE.
Unique Ultra Variable Pressure Detector (UVD II) for SE imaging and CL imaging.
Oxford Xplore EDS system for live elemental mapping and comprehensive analysis.
The SU3800 SEM is extensively used in materials research, nanotechnology, ceramics, composites, polymeric materials, geology, dental materials, biological and soft materials. Its versatile capabilities make it an essential tool for advanced research and quality control across multiple scientific disciplines.
High-Resolution Imaging and Elemental Analysis at Your Fingertips
